The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Apr. 21, 2015
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hiroto Tachikawa, Fujisawa, JP;

Tomoyuki Makihira, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 3/00 (2006.01); A61B 3/113 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0041 (2013.01); A61B 3/113 (2013.01); A61B 3/1225 (2013.01); A61B 3/14 (2013.01);
Abstract

An ophthalmic imaging apparatus performs imaging to produce a tomographic image of a fundus of an examined eye based on interference light obtained by combining measurement light and reference light, determines whether aliasing has occurred in the tomographic image, when it is determined that the aliasing has occurred, moves a position in which an optical path length of the measurement light and an optical path length of the reference light match from a retina side to a choroid side of the examined eye, and generates a fundus image based on the tomographic image that has been produced through imaging in a state where the position has been moved to the choroid side.


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