The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Sep. 06, 2016
Mediatek Inc., Hsinchu, TW;
James June-Ming Wang, San Marino, CA (US);
Jianhan Liu, San Jose, CA (US);
Chao-Chun Wang, Taipei, TW;
YungPing Hsu, Taipei, TW;
MEDIATEK INC., Hsinchu, TW;
Abstract
A method of spatial reuse with opportunistic transmit power control (TPC) and clear channel assessment (CCA) is proposed. In the opportunistic TPC and CCA, a spatial reuse station (SR-STA) gains enough knowledge in certain situation for more aggressive spatial reuse such that its transmit power may be adjusted to meet the spatial reuse conditions based on the received OBSS PPDU and the corresponding spatial reuse parameter (SRP). Both Type 1 SRP and Type 2 SRP are defined. In one example, the Type 1 or Type 2 SRP is a 5-bit parameter carried in the HE-SIG-A field of the OBSS PPDU, which can be a trigger frame, a response frame, a request-to-send (RTS)/clear-to-send (CTS) frame, and a data frame.