The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Dec. 09, 2016
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Shih-Ying Chang, Nantou, TW;

Yan-Hao Huang, Changhua, TW;

Ping-Hai Hsu, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/02 (2009.01); H04W 16/22 (2009.01); H04W 64/00 (2009.01); H04B 17/309 (2015.01); G01D 4/00 (2006.01); G01D 18/00 (2006.01); H04W 84/18 (2009.01);
U.S. Cl.
CPC ...
H04W 16/225 (2013.01); G01D 4/004 (2013.01); G01D 18/00 (2013.01); H04B 17/309 (2015.01); H04W 64/003 (2013.01); H04W 84/18 (2013.01);
Abstract

A method for estimating communication quality of a wireless network applied to an estimation device having a storage device and a processor is provided. The method includes the steps of: providing coordinate information of a plurality of nodes and at least two kinds of map data; associating the coordinate information of the nodes with the map data to map the nodes to the corresponding positions of the maps; extracting spatial feature data between any two nodes from the associated map data, wherein the spatial feature data include spatial distribution data and spatial attribute data; selecting one of a plurality of path loss models according to the spatial feature data between the two nodes and estimating a pass loss using the selected path loss model, thereby estimating the communication quality between the two nodes.


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