The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

May. 20, 2015
Applicant:

Lite-on Technology Corporation, Taipei, TW;

Inventor:

Jau-Yu Chen, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); H04N 13/00 (2006.01); H04N 5/232 (2006.01); G06T 7/571 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
H04N 13/0271 (2013.01); G06T 7/571 (2017.01); G06T 7/593 (2017.01); H04N 5/23212 (2013.01); H04N 13/0022 (2013.01); H04N 13/0203 (2013.01); H04N 13/0242 (2013.01); H04N 2013/0081 (2013.01);
Abstract

An image capturing system comprises a first image capturing module, a second image capturing module and a depth map processing/generating device. The first image capturing module having a first lens, a first aperture and a first image sensor generates a first image corresponding to a first optical-wavelength range. The second image capturing module having a second lens, a second aperture, a third aperture and a second image sensor generates a second image of the first optical-wavelength range and a third image of a second optical-wavelength range. The depth map processing/generating device generates a first depth map according to the parallax of the scene observed in the first image and the second image, and generates a second depth map according to the difference/ratio of sharpness/blur between the second image and the third image, therefore wider range of resolving the object distance and accuracy of the image could be both considered.


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