The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jun. 26, 2013
Applicant:

Nikon Corporation, Tokyo, JP;

Inventor:

Fumihiro Dake, Kawasaki, JP;

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 3/00 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
H04N 7/18 (2013.01); G02B 3/0056 (2013.01); G02B 21/244 (2013.01);
Abstract

A focus position maintaining apparatus and a microscope are provided. The focus position maintaining apparatus can three-dimensionally correct a shift of a specimen in real time to maintain the focal point of an objective lens in a desired position in the specimen, and the microscope includes the focus position maintaining apparatus. The focus position maintaining apparatus includes a microlens array having a plurality of unit lenses and disposed in a position where the microlens array receives light from a specimen via an objective lens, a focus imaging device disposed in a position where the focus imaging device receives light from the unit lenses of the microlens array, and a control unit that outputs a signal for controlling operation of a focus actuator based on image formation positions of a plurality of images of the specimen detected by the focus imaging device via the microlens array.


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