The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jul. 10, 2015
Applicant:

Ixia, Calabasas, CA (US);

Inventors:

Noah Steven Gintis, Westlake Village, CA (US);

Vinod Joseph, Thousand Oaks, CA (US);

Anton-Valentin Pandichie, Bucuresti, RO;

Cristian Florin Iordache, Bucharest, RO;

Assignee:

Ixia, Calabasas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04L 43/087 (2013.01); H04L 43/0817 (2013.01); H04L 43/0829 (2013.01);
Abstract

Methods, systems, and computer readable media for microburst testing are disclosed. According to one method, the method includes defining a test that is divided into one or more test cycles, wherein each test cycle includes a plurality of time intervals for providing packets to destination ports of N ports of the network equipment test device via a plurality of ports of a network switch under test, wherein N is an integer. The method further includes initializing a replication count. The method also includes executing an instance of the test using the replication count. The method further includes monitoring packets switched by each port of the network switch under test to determine an indication of buffering capacity of each port of the network switch under test.


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