The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jun. 04, 2015
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventors:

Ramakrishna Yellapantula, Vernon Hills, IL (US);

Soumyadeep Banerjee, Arlington Heights, IL (US);

Steve Lawrence Sheya, Vernon Hills, IL (US);

Assignee:

LitePoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/20 (2006.01); H04L 1/18 (2006.01); H04L 1/16 (2006.01); H04W 24/06 (2009.01);
U.S. Cl.
CPC ...
H04L 1/203 (2013.01); H04L 1/1607 (2013.01); H04L 1/1812 (2013.01); H04W 24/06 (2013.01);
Abstract

A method for wireless communications testing using downlink (DL) signal transmissions from an access point to a mobile terminal and uplink (UL) signal transmissions from said mobile terminal to said access point. Accurate block error rate (BLER) testing of LTE mobile devices in a wireless signal environment is enabled by preventing repeated transmissions of the same downlink (DL) data block that would normally follow reception of uplink (UL) transmissions of negative UL acknowledgments (NACKs) caused by failures to decode prior DL data transmissions, thereby producing cumulative NACK counts accurately reflecting data reception errors.


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