The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jan. 19, 2016
Applicant:

Maxlinear Asia Singapore Pte Ltd., Singapore, SG;

Inventors:

Russell Romano, Allentown, PA (US);

Anthony Eugene Zortea, Pipersville, PA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/318 (2015.01); H04B 1/16 (2006.01); H04L 27/06 (2006.01); H04L 1/00 (2006.01); H04L 25/06 (2006.01);
U.S. Cl.
CPC ...
H04B 17/318 (2015.01); H04B 1/16 (2013.01); H04L 1/0045 (2013.01); H04L 25/067 (2013.01); H04L 27/06 (2013.01);
Abstract

The peak level of a high frequency analog signal in an RF receiver is detected by a system which samples the signal and compares it against a static threshold, generating an above/below status. The system is implemented with a sampler of sufficient aperture bandwidth to capture the signal in question, operated at a clock frequency, dynamically chosen as a function of f(local oscillator frequency) and the desired f(intermediate frequency), to minimize in-band intermodulation products. The sampler produces kickback intermodulation products that are positioned out-of-band, or are of low enough power in-band so as to be inconsequential. Samples are taken for a statistically significant period of time, and the status is used to adapt the threshold to systematically determine the peak amplitude of the signal being observed.


Find Patent Forward Citations

Loading…