The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jan. 03, 2017
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Pourya Assem, Northbrook, IL (US);

Hun Seok Kim, Ann Arbor, MI (US);

Jing-Fei Ren, Plano, TX (US);

Srinath Mathur Ramaswamy, Murphy, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 5/00 (2006.01); H04B 17/318 (2015.01); H04W 4/02 (2009.01); H04B 17/27 (2015.01); H04W 4/00 (2009.01);
U.S. Cl.
CPC ...
H04B 5/0043 (2013.01); H04B 17/27 (2015.01); H04B 17/318 (2015.01); H04W 4/008 (2013.01); H04W 4/023 (2013.01);
Abstract

Methods and apparatus to determine nearfield localization using phase and received signal strength indication (RSSI) diversity are disclosed. An example method includes determining a first strength of an electric field and a second strength of a magnetic field, the electric field and the magnetic field associated with an electromagnetic signal sent from a transmitter; determining a difference between the first strength and the second strength; and determining a transmitter distance based on the difference between the first strength and the second strength.


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