The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Aug. 13, 2013
Applicant:

Empire Technology Development Llc, Wilmington, DE (US);

Inventor:

Hyoung-Gon Lee, Gapyeong-gun, KR;

Assignee:

EMPIRE TECHNOLOGY DEVELOPMENT LLC, Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 16/16 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01); G06F 3/06 (2006.01); G11C 16/14 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3431 (2013.01); G06F 3/0608 (2013.01); G06F 3/0652 (2013.01); G06F 3/0653 (2013.01); G06F 3/0679 (2013.01); G11C 16/14 (2013.01); G11C 16/349 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 29/50 (2013.01);
Abstract

Technologies are generally described for a memory system that may be a solid-state drive (SDD). The memory system may include memory blocks, where each memory block may have multiple memory pages, and each memory page may have multiple memory cells. The memory cells may have multiple programmed states. In various examples, a method to control the memory system may include determining one or more memory pages to be analyzed, identifying read threshold voltages of each memory cell associated with the memory pages to be analyzed, performing statistical analysis on the identified read threshold voltages, and determining a distribution of the read threshold voltages based at least in part on the statistical analysis.


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