The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Jun. 16, 2014
Altek Semiconductor Corp., Hsinchu, TW;
Yu-Chia Chung, Taipei, TW;
Wen-Yan Chang, Miaoli County, TW;
Chia-Chun Tseng, Hsinchu, TW;
Yun-Chin Lee, New Taipei, TW;
Altek Semiconductor Corp., Hsinchu, TW;
Abstract
Method and apparatus for optimizing depth information are provided. One of a left image and a right image is divided into a plurality of segmentations for obtaining a plurality of segmentation maps. A necessary repair depth map is obtained, and the necessary repair depth map is partitioned into a plurality of depth planes according to a plurality of primary depth values and a camera parameter. The primary depth values are recorded in the necessary repair depth map having a plurality of holes. A plurality of optimized depth values are respectively generated for the holes in each of the depth planes by using the segmentation maps, and the optimized depth values are filled into the depth planes to obtain an optimized depth map.