The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Apr. 02, 2014
Megachips Corporation, Osaka-shi, JP;
Yusuke Mizuno, Osaka, JP;
MegaChips Corporation, Osaka-shi, JP;
Abstract
A WT unit performs wavelet transformation on original image data to generate first image data. An ROI developing unit, based on ROI information, specifies an ROI corresponding portion corresponding to an ROI and a non-ROI corresponding portion corresponding to a non-ROI to the first image data. A high-frequency cutting unit performs, on the first image data, a high-frequency cutting process that cuts a high-frequency component of the non-ROI corresponding portion. A low-frequency blurring unit performs, on the first image data, a low-frequency blurring process that blurs a low-frequency component of the non-ROI corresponding portion. The IWT unit performs inverse wavelet transformation on second image data (first image data obtained after the high-frequency cutting process and the low-frequency blurring process are performed) to generate third image data.