The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jul. 09, 2015
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Kumar Desappan, C.V. Raman, IN;

Prashanth R. Viswanath, Bangalore, IN;

Pramod Kumar Swami, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 9/20 (2006.01); G06K 9/00 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06K 9/00973 (2013.01); G06T 7/73 (2017.01); G06T 9/20 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20164 (2013.01);
Abstract

Systems and methods are provided for selecting feature points within an image. A plurality of candidate feature points are identified in the image. A plurality of feature points are selected for each of the plurality of candidate feature points, a plurality of sets of representative pixels. For each set of representative pixels, a representative value is determined as one of a maximum chromaticity value and a minimum chromaticity value from the set of representative pixels. A score is determined for each candidate feature point from the representative values for the plurality of sets of representative pixels associated with the candidate feature point. The feature points are selected according to the determined scores for the plurality of candidate feature points.


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