The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jul. 17, 2014
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Nobuaki Tojo, Tachikawa, JP;

Hidenori Matsuzaki, Fuchu, JP;

Akira Kuroda, Yokohama, JP;

Mayuko Koezuka, Ota-ku, JP;

Assignee:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01);
Abstract

According to an embodiment, a system includes an analysis generator, a trace difference generator, a program difference generator, and an analyzer. The analysis generator is configured to generate program information required in executing a program, generate trace information providing a description of an execution at particular timing, based on the program information, and generate a trace correspondence between the trace and program information. The trace difference generator is configured to generate a trace difference between first and second trace information. The program difference generator is configured to generate a program difference between first and second program information. The analyzer is configured to analyze a correspondence relation between the differences and the program information based on the trace correspondence.


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