The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Oct. 16, 2015
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Kenichiro Abe, Tokyo, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/02 (2006.01); G02B 13/24 (2006.01); G02B 21/33 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 13/24 (2013.01); G02B 21/33 (2013.01);
Abstract

An objective for a microscope includes, in order from an object side, a first lens group with positive refractive power, a second lens group with positive refractive power, and a third lens group with negative refractive power. When NA represents a numerical aperture of the objective, FN represents a field number of the objective, β represents a magnification of the objective, ε represents an Airy disk diameter on an axis to a d-line of the objective, φrepresents a maximum value of an effective diameter of a lens included in the objective, and hrepresents a radius of an exit pupil of the objective, the objective satisfies the following conditional expressions:0.8≦NA≦1.5  (1)1000≦FN/|β|/ε≦10000  (2)1.7≦φ/2//NA≦4  (3).


Find Patent Forward Citations

Loading…