The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Aug. 27, 2014
General Electric Company, Schenectady, NY (US);
Ertugrul Berkcan, Clifton Park, NY (US);
John Scott Price, Niskayuna, NY (US);
Edward James Nieters, Burnt Hills, NY (US);
William Robert Ross, Rotterdam, NY (US);
Clifford Bueno, Clifton Park, NY (US);
Yuri Alexeyevich Plotnikov, Niskayuna, NY (US);
Susanne Madeline Lee, Cohoes, NY (US);
Other;
Abstract
A well integrity inspection system configured to inspect a well structure including multiple concentric layers. The well integrity inspection system includes an inspection probe positioned in the well structure. The inspection probe includes a plurality of excitation assemblies for transmitting a plurality of radiation emissions into the well structure. The plurality of excitation assemblies includes at least a neutron excitation assembly and an X-ray excitation assembly. The inspection probe also includes a plurality of detection assemblies configured to receive a plurality of backscatter radiation returns from the well structure. The plurality of detection assemblies includes at least a neutron detection assembly and an X-ray detection assembly. The well integrity inspection system further including a processor operatively coupled to the inspection probe. The processor is configured to determine a well integrity parameter of the well structure based on at least one of the plurality of backscatter radiation returns.