The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Mar. 25, 2011
Applicant:

Paul-henri Pugliesi-conti, Hermanville sur Mer, FR;

Inventor:

Paul-Henri Pugliesi-Conti, Hermanville sur Mer, FR;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G06F 11/25 (2006.01); G06F 11/00 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318588 (2013.01);
Abstract

Methods, devices and circuits are provided for protecting secure data from being read during a scan chain output. A plurality of scan flip-flops is coupled in a scan chain, and an input circuit is configured to shift input data to the scan flip-flops. A protection circuit is coupled to the scan flip-flops, and the protection circuit configured to detect scan-in of data from the input circuit to a designated one of the scan flip-flops. Scan-out of data from the designated scan flip-flop is enabled in response to detection of a scan-in of data from the input circuit to the designated scan flip-flop. Scan-out of data from the designated scan flip-flop is prevented in response to no detection of scan-in of data from the input circuit to the designated scan flip-flop.


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