The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Dec. 02, 2013
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Makoto Katsukura, Tokyo, JP;

Masanori Nakata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/14 (2006.01); G01R 19/165 (2006.01); G01R 21/00 (2006.01); G08B 21/04 (2006.01); G06Q 50/06 (2012.01);
U.S. Cl.
CPC ...
G01R 19/16547 (2013.01); G01R 21/00 (2013.01); G08B 21/0484 (2013.01); G06Q 50/06 (2013.01);
Abstract

A fault detection device comprises: a measurement data acquirer that acquires measurement data for current flowing on power supply lines that are connected to multiple electrical devices; a clusterer that classifies the measurement data for a past fixed period into multiple clusters based on at least one of frequency and phase with respect to an AC cycle; a pattern analyzer that analyzes each of the clusters for an appearance pattern of measurement data that satisfy a preset standard; and a fault determiner that determines the occurrence of a fault when measurement data is acquired that differs from the analyzed appearance pattern.


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