The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Jul. 20, 2011
Marta Mainar López, Saragossa, ES;
David Izquierdo Núñez, Saragossa, ES;
Iñigo Salinas Áriz, Saragossa, ES;
Carlos Heras Vila, Saragossa, ES;
Rafael Alonso Esteban, Saragossa, ES;
Francisco Villuendas Yuste, Saragossa, ES;
Ana Margarita Lopéz DE Lama, Saragossa, ES;
Javier Asensio Pérez-ullivarri, Saragossa, ES;
Marta Mainar López, Saragossa, ES;
David Izquierdo Núñez, Saragossa, ES;
Iñigo Salinas Áriz, Saragossa, ES;
Carlos Heras Vila, Saragossa, ES;
Rafael Alonso Esteban, Saragossa, ES;
Francisco Villuendas Yuste, Saragossa, ES;
Javier Asensio Pérez-Ullivarri, Saragossa, ES;
Abengoa Solar New Technologies, S.A., Seville, ES;
Abstract
The invention relates to a portable reflectometer and to a method for characterizing the collector mirrors used in solar power plants for the in-field characterization of reflection coefficients. The equipment includes all of the components required for this measurement, such as a module to measure the reflection coefficient of the mirror, an electronic data acquisition and processing system, a system for processing data and controlling the equipment, a system for storing the data of interest, a user interface system, and a system allowing communication between the aforementioned systems and an outer casing. The equipment can be used to characterize the specular reflection coefficient of flat or curved mirrors of different thicknesses, without requiring adjustments to be made to the equipment, minimizing the influence of diffuse reflection on the measurement.