The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jul. 11, 2013
Applicant:

Persys Technology Ltd., Kiryat Gat, IL;

Inventors:

Yitzhak Vanek, Los Gatos, CA (US);

Leo Mendelovici, Mevaseret Ziyon, IL;

Gideon Drimer, Herzeliya, IL;

Assignee:

PERSYS TECHNOLOGY LTD., Kiryat Gat, IL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 15/06 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0612 (2013.01); G01N 2015/0046 (2013.01);
Abstract

A method and apparatus for determining cleanliness of a sample is provided. The method includes taking a first reading of particles count of a sample placed into a chamber. The method further includes directing a stream of air over the sample, and taking a second reading of particles count of the sample. The method further includes calculating a difference between the first reading and the second reading, and determining a cleanliness of the sample based upon the difference. The method further includes option of taking an additional reading while a stream of ionized air is directed towards the sample. The method further includes trapping the impurities particles released from the sample by applying a vacuum through the filter, and analyzing the trapped particles to determine nature and chemical composition of the impurities particles.


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