The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Mar. 28, 2014
Applicants:

Udayan Kanade, Pune, IN;

Manohar Joshi, Pune, IN;

Sanat Ganu, Pune, IN;

Inventors:

Udayan Kanade, Pune, IN;

Manohar Joshi, Pune, IN;

Sanat Ganu, Pune, IN;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/04 (2006.01); G01N 3/02 (2006.01); G01N 3/06 (2006.01); G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 3/02 (2013.01); G01N 3/068 (2013.01); G01N 3/08 (2013.01); G01N 2203/0254 (2013.01); G01N 2203/0282 (2013.01); G01N 2203/0641 (2013.01); G01N 2203/0647 (2013.01);
Abstract

A universal materials testing machine is disclosed. In one embodiment, the machine comprises a plurality of grips holding a circular material specimen sheet; the grips being capable of pulling the material specimen radially outward. Each grip is connected to a force measurement sensor such as a load cell. The grip and the load cell assembly is connected to a linear actuator assembly. The linear actuator assembly comprises a motor connected to an arm that can move along a straight line. The actuator pulls or pushes the load cell and grip assembly. A camera module captures images of the specimen while being stretched or released. A data processing system gathers camera module images along with force measurements from the load cells. An analysis module running on the data processing unit computes stress and strain measurements and fits them to user selectable material model.


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