The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Jun. 06, 2013
Applicants:

Kirt Alan Winter, San Diego, CA (US);

Jose Julio Doval, Escondido, CA (US);

Inventors:

Kirt Alan Winter, San Diego, CA (US);

Jose Julio Doval, Escondido, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 11/00 (2006.01); G01S 13/58 (2006.01); G01S 13/86 (2006.01); G01P 21/02 (2006.01); G01D 21/02 (2006.01); G01S 13/88 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); A63B 69/00 (2006.01);
U.S. Cl.
CPC ...
G01D 11/00 (2013.01); G01D 21/02 (2013.01); G01P 21/02 (2013.01); G01S 13/58 (2013.01); G01S 13/581 (2013.01); G01S 13/867 (2013.01); G01S 13/88 (2013.01); G06K 9/00342 (2013.01); G06K 9/6284 (2013.01); A63B 2069/0006 (2013.01); A63B 2069/0008 (2013.01); A63B 2069/0011 (2013.01); A63B 2220/35 (2013.01); A63B 2220/40 (2013.01); A63B 2220/806 (2013.01); A63B 2220/808 (2013.01); A63B 2220/833 (2013.01); A63B 2220/89 (2013.01); A63B 2225/20 (2013.01); A63B 2225/50 (2013.01); A63B 2230/06 (2013.01); A63B 2230/30 (2013.01); A63B 2230/50 (2013.01);
Abstract

A sensor system and method of using the system synergistically to improve the accuracy and usefulness of measured results is described. The system is comprised of electronically linked components that act as markers to trigger events, producers that gather data from sensors and aggregators that combine the data from a plurality of producers using triggers from marker devices to select the data of interest. The system is shown to be applicable to selection of data regions of interest and to analysis of the data to improve accuracy. The analysis of the data of any particular sensor within the system makes use of extrinsic data, being data generated by other sensors and intrinsic data, that is data or data limits that are known to be true from nature, laws of physics or just the particular information the user wants to acquire. The system is demonstrated on the analysis of Doppler radar measurements of a thrown object.


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