The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Nov. 08, 2016
Faro Technologies, Inc., Lake Mary, FL (US);
Sebastian Bartmann, Stuttgart, DE;
Helmut Kramer, Mainbernheim, DE;
Daniel Pompe, Stuttgart, DE;
Michael Schanz, Gerlingen, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
A method for optically scanning and measuring a scene by a laser scanner includes generating multiple scans; tracking scanner positions with a position-tracking device for the multiple scans and providing tracked scanner positions in response; registering sequentially scans selected from the multiple scans into clusters using registration points or targets and confirming registration of the scans into the clusters according to specified quality criteria being fulfilled; selecting scans from the clusters and forming pairs of scans; forming an intersection of the selected pairs and comparing a size of the intersection with a threshold value obtained based at least in part on the tracked scanner positions; and attempting to register the pairs of scans if the size of the intersection exceeds the threshold value and accepting the registered pairs of scans if the registration is successful.