The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Oct. 28, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Shinya Katsumata, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A radiation imaging system including an X-ray sensor with a plurality of sensor chips disposed next to each other and an image processing apparatus which performs abnormality determination concerning a white image obtained by irradiating the X-ray sensor with X-rays without any object disposed between the X-ray sensor and an X-ray generator, the system includes: an area acquisition unit configured to acquire information of partial areas of the white image which respectively correspond to the plurality of sensor chips; a distribution acquisition unit configured to acquire distribution information representing variation in pixel value for each of the acquired partial areas; and a determination unit configured to determine, based on the distribution information, whether abnormality is included in the white image.