The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Nov. 19, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Jae Mock Yi, Hwaseong-si, KR;

Dong Goo Kang, Hwaseong-si, KR;

Young Hun Sung, Hwaseong-si, KR;

Jae Hak Lee, Yongin-si, KR;

Seok Min Han, Seongnam-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/04 (2006.01); A61B 6/12 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/4035 (2013.01); A61B 6/469 (2013.01); A61B 6/487 (2013.01); A61B 6/54 (2013.01); G01N 23/04 (2013.01); A61B 6/12 (2013.01); A61B 6/467 (2013.01); A61B 6/481 (2013.01); A61B 6/504 (2013.01); G01N 2223/314 (2013.01); G01N 2223/427 (2013.01);
Abstract

An X-ray imaging apparatus and method are provided. The X-ray imaging apparatus according to an aspect includes an X-ray source configured to radiate X-rays onto a subject region, an X-ray detector configured to detect the radiated X-rays and obtain a plurality of frame images of the subject region, and an ROI filter located between the X-ray source and the X-ray detector, configured to move toward the X-ray source and the X-ray detector, and configured to filter the X-rays radiated from the X-ray source.


Find Patent Forward Citations

Loading…