The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Aug. 20, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
Xin Yu Liu, Cheltenham, AU;
Pantelis Elinas, Glebe, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method of tracking an object in a plurality of image frames includes receiving an initial contour associated with the edge object in a first one of the image frames. A plurality of first measurement points distributed non-uniformly along the initial contour are determined. The first measurement points are biased to relatively high information portions of the initial contour. A set of subsequent contours are estimated from the initial contour in a second image frame. An identical plurality of second measurement points are determined along each of the set of estimated subsequent contours in the second image frame using the same non-uniform distribution of the first measurement points in the first image frame. The method selects at least one contour of the set of estimated subsequent contours using a confidence measure determined from the second measurement points as distributed along the selected subsequent contour.