The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Oct. 27, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Aaron L. Frank, Murphy, TX (US);

Hamid R. Safiri, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01); H03L 7/099 (2006.01); H03L 1/02 (2006.01); H03L 7/085 (2006.01);
U.S. Cl.
CPC ...
H03L 7/099 (2013.01); H03L 1/023 (2013.01); H03L 7/085 (2013.01);
Abstract

A phase look loop (PLL) device has a dynamic lock range that is based on a temperature measured during a calibration process. The PLL device includes a calibration circuit configured to receive a temperature reading corresponding to a junction temperature of the PLL device during the calibration process. Based on this temperature reading, the calibration circuit initiates a preset procedure that presets a control voltage of a voltage control oscillator in the PLL device. The preset procedure implements a calibration function defined by a slope with a numerator component and a denominator component. The numerator component corresponds to a range of the control voltage, whereas the denominator component corresponds to a range of ambient temperatures within which the PLL device operates.


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