The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Mar. 20, 2015
Disney Enterprises, Inc., Burbank, CA;
Kartic Subr, Edinburgh, GB;
Kenneth Mitchell, Earlston, GB;
Wojciech Jarosz, Zurich, CH;
Derek Nowrouzezahrai, Quebec, CA;
Disney Enterprises, Inc., Burbank, CA (US);
Abstract
Systems, methods and articles of manufacture for sampling visual characteristics of a three-dimensional scene. Embodiments include collecting a plurality of samples within the three-dimensional scene. Upon determining that a combined stratified importance sampling algorithm will result in reduced error for a rendered image of the three-dimensional scene, embodiments collect the plurality of samples using the combined stratified importance sampling algorithm, and otherwise the plurality of samples are collected using a stratified sampling algorithm. The combined stratified importance sampling algorithm integrates an antithetic sampling algorithm. One or more lighting effects for the three-dimensional scene are simulated based on the plurality of samples and data describing one or more light sources for the three-dimensional scene. Embodiments further include rendering the image based on the simulated one or more lighting effects and data describing characteristics of the three-dimensional scene.