The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Jun. 05, 2015
Applicants:
Xun Xu, Cupertino, CA (US);
Peng YE, Foster City, CA (US);
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 5/00 (2006.01); G06K 9/66 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06N 3/08 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/46 (2013.01); G06K 9/6215 (2013.01); G06K 9/66 (2013.01); G06N 3/08 (2013.01); G06T 5/002 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30168 (2013.01);
Abstract
Embodiments generally relate to providing systems and methods for assessing image quality of a distorted image relative to a reference image. In one embodiment, the system comprises a convolutional neural network that accepts as an input the distorted image and the reference image, and provides as an output a metric of image quality. In another embodiment, the method comprises inputting the distorted image and the reference image to a convolutional neural network configured to process the distorted image and the reference image and provide as an output a metric of image quality.