The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Jun. 05, 2013
Applicant:
Agfa Healthcare NV, Mortsel, BE;
Inventors:
Marc Cresens, Mortsel, BE;
Herman Van Goubergen, Mortsel, BE;
Assignee:
AGFA HEALTHCARE NV, Mortsel, BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); H04N 5/32 (2006.01); G01T 7/00 (2006.01); G06T 7/00 (2017.01); G01N 23/04 (2006.01); G06T 5/40 (2006.01); G06T 7/80 (2017.01); H04N 5/365 (2011.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/005 (2013.01); A61B 6/582 (2013.01); G01N 23/04 (2013.01); G01N 23/046 (2013.01); G01T 7/005 (2013.01); G06T 5/40 (2013.01); G06T 7/0012 (2013.01); G06T 7/80 (2017.01); H04N 5/32 (2013.01); A61B 6/40 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30168 (2013.01); H04N 5/3651 (2013.01);
Abstract
A statistical analysis is performed on pixel values of at least one region of interest in an image obtained by substantially uniform irradiation of an x-ray detector and deciding upon the presence of a source of x-ray beam in-homogeneity by comparing the results of the statistical analysis with at least one predetermined acceptance criterion.