The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Mar. 25, 2014
Applicants:
Sapna A. Shroff, Menlo Park, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Lingfei Meng, Redwood City, CA (US);
Inventors:
Sapna A. Shroff, Menlo Park, CA (US);
Kathrin Berkner, Los Altos, CA (US);
Lingfei Meng, Redwood City, CA (US);
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/00 (2006.01); G02B 3/00 (2006.01); G06T 1/00 (2006.01); G02B 7/38 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 5/003 (2013.01); G02B 3/0043 (2013.01); G06T 1/0007 (2013.01); G02B 3/0056 (2013.01); G02B 7/38 (2013.01); H04N 5/23229 (2013.01);
Abstract
The spatial resolution of captured plenoptic images is enhanced. In one aspect, the plenoptic imaging process is modeled by a pupil image function (PIF), and a PIF inversion process is applied to the captured plenoptic image to produce a better resolution estimate of the object.