The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Jan. 29, 2014
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Mark Gohlke, McKinney, TX (US);
Christopher J. Baker, McKinney, TX (US);
Trent A. Jacobs, McKinney, TX (US);
Assignee:
RAYTHEON COMPANY, Waltham, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); G06T 13/00 (2011.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4007 (2013.01); G06T 3/4092 (2013.01);
Abstract
A system and method for interpolating between pixels of an image for providing zoom and pan features. A piecewise cubic spline is used to find the values of each of four provisional interpolation points in each of four rows of an image and, similarly, a piecewise cubic spline is used to interpolate between the provisional interpolation points to find the value of a point in the output image. Boundary conditions used to constrain the coefficients of the piecewise cubic spline provide enhanced quality in the output image.