The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Oct. 29, 2008
Applicants:
Ying Luo, Stevenson Ranch, CA (US);
Ju Guo, Arcadia, CA (US);
Assignee:
THOMSON LICENSING, Issy-les-Moulineaux, FR;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06T 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/0012 (2013.01);
Abstract
Methods and systems for resizing an image utilizing content-aware seam operations include defining low-energy seams defining contextually less-important information and utilizing such information for interpolation based on one-dimensional manifolds. The interpolation can form new seams and/or regenerated pixels that can be combined with the image to provide a content-aware resized image exhibiting smooth and continuous features.
Luo, Ying. (2017). Method and system for image resizing based on interpolation enhanced seam operations (U.S. Patent No. 9741092). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9741092
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile