The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9740739 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 22, 2017

Filed:

Oct. 04, 2014
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Ziyang Liu, Santa Clara, CA (US);

Vahit Hacigumus, San Jose, CA (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30466 (2013.01);
Abstract

Systems and methods are disclosed for query processing in a big data analytics platform by enumerating plans for a current query using a processor; building a dominance graph for the current query; for each plan, determining a regret value and a score for the plan based on the regret value and cost; and selecting query plans in an online fashion for query processing in big data analytics platforms where intermediate results are materialized and can be reused later.


Find Patent Forward Citations

Liu, Ziyang. (2017). Visionary query processing in hadoop utilizing opportunistic views (U.S. Patent No. 9740739). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9740739

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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