The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Dec. 02, 2014
Applicant:

Autodesk, Inc., San Rafael, CA (US);

Inventors:

Oytun Akman, Kensington, CA (US);

Ronald Poelman, San Rafael, CA (US);

Seth Koterba, Valrico, FL (US);

Assignee:

Autodesk, Inc., San Rafael, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06K 9/46 (2006.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30247 (2013.01); G06F 17/3053 (2013.01); G06F 17/30598 (2013.01); G06K 9/46 (2013.01); G06T 17/20 (2013.01);
Abstract

A method, system, apparatus, article of manufacture, and computer-readable storage medium provide the ability to merge multiple point cloud scans. A first raw scan file and a second raw scan file (each including multiple points) are imported. The scan files are segmented by extracting segments. Features are extracted from the segments. A set of candidate matching feature pairs are acquired by registering/matching/pairing features from one scan to features from another scan. The candidate pairs are refined based on an evaluation of all of the matching pairs. The candidate pairs are further refined by extracting sample points from the segments (within the matched pairs) and refining the pairs based on the points. The feature pairs are scored and then merged based on the scores.


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