The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Apr. 12, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hiroshi Kanayama, Kanagawa-ken, JP;

Takuma Murakami, Tokyo, JP;

Daisuke Takuma, Tokyo-to, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01); G06F 17/20 (2006.01); G06F 17/21 (2006.01); G06F 17/28 (2006.01);
U.S. Cl.
CPC ...
G06F 17/2785 (2013.01);
Abstract

A computer-implemented method, program product, and system, for extracting pieces of text from a plurality of pieces of text. The method includes: primarily evaluating a measure of positive expressions and a measure of negative expressions included in each of pieces of text; secondarily evaluating each of the pieces of text on the basis of a plurality of evaluation functions, where certain evaluation functions among the plurality of evaluation functions include, as variables, the measure of positive expressions and the measure of negative expressions; and extracting a piece of text having an evaluation result with a higher rating in preference to a piece of text having an evaluation result with a lower rating, where the individual evaluation results are based on the same evaluation function among the plurality of evaluation functions.


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