The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Oct. 29, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Jim Enright, Slough, GB;

Nicholas Wilson, Middlesex, GB;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3414 (2013.01); G06F 11/3428 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 11/3485 (2013.01);
Abstract

A method of producing a benchmark application for testing input/output—I/O—settings of a computer application, the method comprising: compiling trace data relating to operations to be executed by the computer application; grouping the trace data into one or more phases, based on different stages in the execution of the computer application to which the operations relate; identifying patterns in the trace data and comparing the patterns; producing simplified trace data in which trace data having similar patterns are combined; and outputting a benchmark application which includes the simplified trace data and information indicating where the trace data have been combined.


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