The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Mar. 11, 2016
Equipment evaluation device, equipment evaluation method and non-transitory computer readable medium
Kabushiki Kaisha Toshiba, Tokyo, JP;
Hideyuki Aisu, Kanagawa, JP;
Toshimitsu Kumazawa, Kanagawa, JP;
Mitsunobu Yoshida, Kanagawa, JP;
Mikito Iwamasa, Tokyo, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
According to one embodiment, an equipment evaluation system includes: an estimator, an acquirer, a hardware storage and an evaluator. The estimator is implemented by the computer, to estimate a probability density distribution of a parameter representing performance of subject equipment based on measurement data of the subject equipment, the measurement data resulting from a measurement performed at each of a plurality of times. The acquirer acquires a use pattern of the subject equipment. The hardware storage stores the use pattern in association with the probability density distribution for the subject equipment. The evaluator identifies a use pattern of the subject equipment, the use pattern being similar to a use pattern of a first equipment that is different from the subject equipment, and evaluates future performance degradation of the first equipment using probability density distributions corresponding to the identified use pattern.