The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Apr. 11, 2013
Bioaxial Sas, Paris, FR;
Gabriel Y. Sirat, Paris, FR;
Louis Philippe Braitbart, Paris, FR;
Bioaxial SAS, , FR;
Abstract
The invention relates to an optical measurement method and to an optical measurement device for determining the spatial or spatiotemporal distribution of a sample, the sample comprising at least one retransmission source, said at least one retransmission source retransmitting light depending on the projected light, according to a predetermined law, onto the sample, the method comprising: the projection onto the sample of at least two compact light distributions belonging to different topological families, which propagate along the same optical path, the detection of the light retransmitted by said at least one retransmission source of the sample; the generation of at least one optical image from the detected light; and the algorithmic analysis of the optical images for obtaining location data on said at least one retransmission source.