The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Jul. 16, 2013
Fluke Corporation, Everett, WA (US);
Thomas Duffy Anderson, Everett, WA (US);
David Lawrence Epperson, Everett, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
An analytical gateway device receives measurement data comprising one or more measurement values from one or more measurement devices. The gateway device selects a measurement application from a plurality of measurement applications available for execution (e.g., on the gateway device or some other computing device) based at least in part on the measurement data. For example, the measurement application can be selected based on measurement type information. The measurement type information may include one or more measurement units associated with the measurement values. The gateway device may cause a user interface (or some other information) associated with the measurement application to be presented on a display (e.g., a display of the gateway device or some other computing device in communication with the gateway device).