The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Jun. 29, 2012
Alan Joseph Hunter, Delft, NL;
Arno Willem Frederik Volker, Delft, NL;
Alan Joseph Hunter, Delft, NL;
Arno Willem Frederik Volker, Delft, NL;
Abstract
Improved imaging is provided for structures under test that have propagation direction dependent ultrasound propagation speed or position dependent ultrasound propagation speed due to fibrous, coarse grain or single crystalline material. A set reflection points is selected in the structure under test and ultrasound propagation time delays between the reflection point or points on one hand and the plurality of positions on the other hand that fit an observed time delay of the detected reflections are computed. This may be done by means of an iterative method. In the iterative method a synthetically focused ultrasound beam is realized by summing measurements after compensation for propagation time delay from different transmitting transducers to the reflection points. Time delays to receiving transducers are measured from the arrival time of reflections of this synthetically focused ultrasound beam, and the propagation time delay from different transmitting transducers is iteratively adapted until it matches time delays corresponding to the measured arrival times. Time delays to other points in the structure under test are interpolated between the selected reflection points and used in the computation of an image of reflections within the structure under test.