The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Mar. 29, 2016
Olympus Corporation, Tokyo, JP;
Tetsuya Tanabe, Tokyo, JP;
Seiji Kondo, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
In the scanning molecule counting method using optical measurement with a confocal or multiphoton microscope, there is provided a technique of computing a light-emitting particle concentration which changes with time and detecting a concentration change velocity or a reaction velocity. The inventive optical analysis technique of detecting light of light-emitting particles in a sample solution generates time series light intensity data of light from a light detection region detected with moving the position of the light detection region of the microscope in the sample solution; measures successively an interval of generation times of signals of the light-emitting particles detected in the time series light intensity data; and determines the concentration or concentration change velocity of the light-emitting particles, using the successively measured signal generation time intervals.