The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Aug. 31, 2015
Apple Inc., Cupertino, CA (US);
Victor Luzzato, Taipei, TW;
Dale N. Memering, Cupertino, CA (US);
APPLE INC., Cupertino, CA (US);
Abstract
A material testing apparatus and methods of testing material are disclosed. The material testing apparatus may include a support ring contacting a test material and a moveable contact component positioned adjacent to the support ring. The moveable contact component may include a substantially curved contact surface comprising a radius-varying curvature profile formed between a center and a perimeter of the substantially curve contact surface. The curvature profile may be based on a predetermined deflection-force profile specific to the test material. Additionally, the curvature profile may also be based on the material characteristics of the test material, the physical characteristics of the test material, the physical characteristics of the support ring and/or a testing process performed on the test material.