The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Apr. 14, 2016
Applicant:

Digital Direct Ir, Inc., Fresh Meadows, NY (US);

Inventor:

Peter N. Kaufman, Fresh Meadows, NY (US);

Assignee:

DIGITAL DIRECT IR, INC., Fresh Meadows, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/40 (2006.01); G01J 5/20 (2006.01); G01J 5/34 (2006.01); G01J 5/06 (2006.01); G01J 5/04 (2006.01); G01J 1/44 (2006.01); G01J 5/02 (2006.01); G01J 5/10 (2006.01); G01J 5/44 (2006.01); G01J 5/08 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
G01J 5/40 (2013.01); G01J 1/44 (2013.01); G01J 5/023 (2013.01); G01J 5/0225 (2013.01); G01J 5/046 (2013.01); G01J 5/06 (2013.01); G01J 5/0806 (2013.01); G01J 5/10 (2013.01); G01J 5/20 (2013.01); G01J 5/34 (2013.01); G01J 5/44 (2013.01); G01J 2005/0077 (2013.01); G01J 2005/065 (2013.01);
Abstract

Passive detector structures for imaging systems are provided, which are based on a coefficient of thermal expansion (CTE) framework. With such framework, a CTE-based passive detector structure includes a detector member that is configured to expand or contract in response to thermal heating resulting from photon exposure. The expanding/contracting CTE detector structure is configured to exert mechanical forces on resistor and/or capacitor circuit elements, which are part of an oscillator circuit, to vary the resistance and capacitance of such circuit elements and change a frequency or period of oscillation of an output signal of the oscillator circuit. The change in the frequency or period of oscillation of the output signal of the oscillator circuit is utilized to determine an amount of photon exposure of the CTE-based detector.


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