The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Apr. 21, 2014
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Kailash Kiran Patalay, Santa Clara, CA (US);

Aaron Muir Hunter, Santa Cruz, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01J 5/00 (2006.01); G01K 13/00 (2006.01); G01J 5/10 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
G01J 5/10 (2013.01); H01L 21/67115 (2013.01); H01L 21/67248 (2013.01); G01J 2005/0048 (2013.01);
Abstract

The embodiments described herein generally relate to methods of noise compensation for proper temperature detection in thermal processing chambers and devices for achieving the same. Methods can include determining noise produced by a lamp zone and extrapolating the noise from the detected photocurrent. Devices can include a processing chamber, a substrate support disposed in the processing chamber, the substrate support having a high thermal mass, a pyrometer below the substrate support and oriented to view radiation emitted by the substrate and a controller configured to subtract a time invariant noise component and a time variant noise component from the pyrometer signal.


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