The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Sep. 09, 2015
Canon Kabushiki Kaisha, Tokyo, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
To measure a three-dimensional shape of a measurement target object at high speed, an information processing method includes acquiring a captured image captured by an imaging apparatus in a state where a pattern is projected onto the measurement target object, the pattern including a plurality of lines, identification information arranged on or between the lines to identify the lines, and a feature arranged between a plurality of the lines, identifying each line included in the captured image by acquiring a correspondence between each line included in the projected pattern and each line included in the captured image, determining a second region in the pattern corresponding to a first region between the lines in the captured image, and deriving a distance of the measurement target object by acquiring a correspondence between the first region and the determined second region.