The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Aug. 13, 2015
Applicant:

National Sun Yat-sen University, Kaohsiung, TW;

Inventors:

Wei-Hung Su, Kaohsiung, TW;

Bo-Chin Huang, Kaohsiung, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/021 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01);
Abstract

A method using fringe projection to describe the three-dimensional profile of a specular object is presented and has steps of: providing a diffraction grating formed by exposing and developing a hologram and having at least two sets of interference fringes; guiding a conjugate of the reference light generated from a conjugate light source to pass through the diffraction grating, in order to generate a real image with a long depth of field, a wide convergent angle, and a sinusoidal distribution light intensity; projecting this real image onto an inspected specular object; using an image capture device to capture the intensity distribution of the real image on the inspected specular object so as to obtain an image signal; and using an image processor to analyze the image signal so as to identify the profile of the inspected specular object.


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