The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Sep. 11, 2014
Applicant:

Ngk Spark Plug Co., Ltd., Nagoya-shi, Aichi, JP;

Inventors:

Wataru Kawagishi, Ichinomiya, JP;

Shinji Kumazawa, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 41/00 (2006.01); B29C 65/82 (2006.01); B29C 65/16 (2006.01); B29C 65/00 (2006.01); G01N 25/72 (2006.01); G01N 33/44 (2006.01); B29L 9/00 (2006.01);
U.S. Cl.
CPC ...
B32B 41/00 (2013.01); B29C 65/1635 (2013.01); B29C 65/1654 (2013.01); B29C 65/8253 (2013.01); B29C 66/1122 (2013.01); B29C 66/24244 (2013.01); B29C 66/43 (2013.01); B29C 66/5346 (2013.01); B29C 66/7373 (2013.01); B29C 66/91216 (2013.01); B29C 66/91221 (2013.01); B29C 66/9592 (2013.01); G01N 25/72 (2013.01); G01N 33/442 (2013.01); B29C 65/1677 (2013.01); B29C 66/71 (2013.01); B29C 66/721 (2013.01); B29C 66/7212 (2013.01); B29C 66/73921 (2013.01); B29C 66/863 (2013.01); B29C 66/939 (2013.01); B29L 2009/00 (2013.01);
Abstract

A method and apparatus for manufacturing a welded resin article which includes (a) bringing first and second resin members to come into contact with each other; (b) applying laser light to the first and second resin members while moving the laser light relative to the first and second resin members; (c1) obtaining a value corresponding to the intensity of infrared light from a plurality of locations on a surface; (d) successively calculating, as a section average, the average of a predetermined number of successive values, among those obtained from the plurality of locations corresponding to the intensity of the infrared light; (e) a step of successively calculating a deviation judgment value; and (f) a step of successively judging whether or not the deviation judgment value falls within a predetermined judgment threshold range.


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