The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2017
Filed:
Jan. 14, 2013
Applicant:
Futurewei Technologies, Inc., Plano, TX (US);
Inventors:
George Calcev, Hoffman Estates, IL (US);
Bin Chen, Schaumburg, IL (US);
Lin Cai, Schaumburg, IL (US);
Lukasz Krzymien, Rolling Meadows, IL (US);
Assignee:
FUTUREWEI TECHNOLOGIES, INC., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 24/10 (2009.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/00 (2013.01); H04W 24/10 (2013.01); H04W 24/08 (2013.01);
Abstract
A method for measuring delay in a wireless fidelity (WiFi) network includes measuring a delay associated with transmission of a packet through the WiFi network in response to a measurement request from a requesting device, and contending for access to a communications channel of the WiFi network after measurement of the delay. The method also includes transmitting the delay as measured to the access point using the communications channel after a successful contention.