The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2017

Filed:

Jun. 01, 2011
Applicants:

Ajay K. Venkatsuresh, San Diego, CA (US);

Suresh Sanka, San Diego, CA (US);

Inventors:

Ajay K. Venkatsuresh, San Diego, CA (US);

Suresh Sanka, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 12/02 (2009.01); H04L 9/08 (2006.01); H04L 29/06 (2006.01); H04W 80/02 (2009.01);
U.S. Cl.
CPC ...
H04W 12/02 (2013.01); H04L 9/0816 (2013.01); H04L 63/0457 (2013.01); H04L 63/162 (2013.01); H04L 2209/80 (2013.01); H04W 80/02 (2013.01);
Abstract

Disclosed are methods and apparatus for detecting mismatch of ciphering parameters, such as Count-C, in a wireless device and recovery therefrom. The methods and apparatus for detection include examining a predefined ciphered field, such as a Length Indicator field, in one or more received Radio Link Control (RLC) Protocol Data Units (PDUs). Next, a determination of when the field is invalid over a predetermined sample number of PDUs is performed. Mismatch of ciphering parameters can then be determined when a predetermined number of samples of the field detected as invalid exceed a predetermined threshold. Additionally, recovery of PDUs after mismatch detections is disclosed using a range of Hyper-Frame Numbers (HFNs) to decipher buffered PDUs, and then check which of the HFNs eliminate the parameter mismatch by again determining if parameter mismatch occurs using the methods and apparatus for detection.


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